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题名/责任者:

Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) / editors, A. Benninghoven ... [et al.].

出版发行项:

Berlin : Springer-Verlag, 1979.

ISBN:

3540098437

载体形态项:

xiii, 298 p. : ill. ; 24 cm.

变异题名:

SIMS-II

丛编说明:

Springer series in chemical physics ; 9

丛编统一题名:

Springer series in chemical physics ; v. 9.

会议名称:

International Conference on Secondary Ion Mass Spectrometry (2nd : 1979 : Stanford University)

附加个人名称:

Benninghoven, A.

论题主题:

Secondary ion mass spectrometry-Congresses.

中图法分类号:

O657.4-53

书目附注:

Includes bibliographical references and index.

豆瓣简介：