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- 题名/责任者:
- Scanning electron microscopy/1980 : an international review of advances in techniques and applications of the scanning electron microscope.
- 出版发行项:
- Chicago, Ill. : Scanning Electron Microscopy, Inc., 1980.
- ISBN:
- 0931288002 (v. 1)
- ISSN:
- 0586-5581
- 载体形态项:
- 4 v. : ill. ; 29 cm.
- 会议名称:
- Scanning Electron Microscope Symposium (1980)
- 附加团体名称:
- IIT Research Institute.
- 论题主题:
- Scanning electron microscopy-Congresses.
- 中图法分类号:
- TN153
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