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题名/责任者:

Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / edited by Brian K. Tanner and D. Keith Bowen.

出版发行项:

New York, N.Y. : Plenum Press, c1980.

ISBN:

0306406284

载体形态项:

xxvi, 589 p. : ill. ; 26 cm.

丛编题名:

NATO advanced study institutes series : Series B, Physics ; v. 63

会议名称:

NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods (1979 : Durham, England)

附加个人名称:

Tanner, B. K. (Brian Keith)

附加个人名称:

Bowen, D. Keith (David Keith), 1940-

论题主题:

Crystals-Defects-Congresses.

论题主题:

X-ray crystallography-Congresses.

中图法分类号:

O72-53

一般附注:

"Published in cooperation with NATO Scientific Affairs Division."

书目附注:

Includes bibliographical references and index.

豆瓣简介：