MARC状态：已编 文献类型：西文图书 浏览次数：75
- 题名/责任者:
- Microelectronics measurement technology seminar : proceedings : March 11-12, 1980, San Jose, CA / organized and producted by Benwill Publishing Corporation.
- 出版发行项:
- Boston, MA : Benwill Publishing Corporation, 1980.
- 载体形态项:
- 344 p. : ill.
- 中图法分类号:
- TN407-53
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