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题名/责任者:

Scanning electron microscopy/1980 : an international review of advances in techniques and applications of the scanning electron microscope.

出版发行项:

Chicago, Ill. : Scanning Electron Microscopy, Inc., 1980.

ISBN:

0931288002 (v. 1)

ISSN:

0586-5581

载体形态项:

4 v. : ill. ; 29 cm.

会议名称:

Scanning Electron Microscope Symposium (1980)

附加团体名称:

IIT Research Institute.

论题主题:

Scanning electron microscopy-Congresses.

中图法分类号:

TN153

豆瓣简介：