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题名/责任者:

Point defects in semiconductors / M. Lannoo, J. Bourgoin.

出版发行项:

Berlin ; New York : Springer-Verlag, 1981-1983.

ISBN:

0387105182 (U.S. : v. 1)

ISBN:

0387115153 (U.S. : v. 2)

载体形态项:

2 v. : ill. ; 24 cm.

丛编说明:

Springer series in solid-state sciences ; 22, 35

个人责任者:

Lannoo, M. (Michel), 1942-

附加个人名称:

Bourgoin, J. (Jacques), 1938-

论题主题:

Semiconductors-Defects.

论题主题:

Point defects.

中图法分类号:

O471

一般附注:

Vol. 2 by J. Bourgoin, M. Lannoo, with a foreword by G.D. Watkins.

书目附注:

Includes bibliographical references and index.

内容附注:

1. Theoretical aspects -- 2. Experimental aspects.

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