-
西文图书1.Patterning of material layers in submicron region / O4/T163
馆藏复本:1
可借复本:0 U.S. Tandon, W.S. Khokle.
J. Wiley, 1993.
(0) 馆藏
-
西文图书2.Integrated circuit design, fabrication and test / O45/S548
馆藏复本:1
可借复本:0 Peter Shepherd.
McGraw-Hill, c1996.
(0) 馆藏