机读格式显示(MARC)

• 000 02048nam a2200325 i 4500

• 001 0000728302

• 003 SCNU

• 005 20200929171100.0

• 008 181029s2018 caua b 001 0 eng d

• 010 __ |a 2017962466

• 020 __ |a 9780128133477

• 040 __ |a NPU |b eng |c NPU |e rda

• 093 __ |a TH742 |2 5

• 099 __ |a CAL 022018098570

• 245 00 |a Quantitative data processing in scanning probe microscopy : |b spm applications for nanometrology / |c [edited by] Petr Klapetek.

• 250 __ |a Second edition.

• 264 _1 |a Cambridge, CA : |b Elsevier, |c [2018]

• 300 __ |a xviii, 397 pages : |b illustrations ; |c 24 cm.

• 336 __ |a text |b txt |2 rdacontent

• 337 __ |a unmediated |b n |2 rdamedia

• 338 __ |a volume |b nc |2 rdacarrier

• 490 0_ |a Micro and nano technologies series

• 504 __ |a Includes bibliographical references and index.

• 520 __ |a Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software.Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap.

• 650 _0 |a Scanning probe microscopy.

• 650 _0 |a Scanning probe microscopy |x Data processing.

• 650 _0 |a Qualitative research |x Data processing.

• 700 1_ |a Klapetek, Petr, |e editor.

• 920 __ |a 242430 |z 1

• 950 __ |a SCNU |f TH742/K63-2