机读格式显示(MARC)

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• 008 981214s1985 wb a b 00110 eng

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• 040 __ |c SJT

• 050 0_ |a QH212.S3 |b R452 1985

• 082 0_ |a 535/.3325 |2 19

• 093 __ |a TN153 |2 4

• 099 __ |a CAL 022000306651

• 100 1_ |a Reimer, Ludwig, |d 1928-

• 245 10 |a Scanning electron microscopy : |b physics of image formation and microanalysis / |c Ludwig Reimer.

• 260 __ |a Berlin ; |a New York : |b Springer-Verlag, |c c1985.

• 300 __ |a xviii, 457 p. : |b ill. ; |c 24 cm.

• 440 _0 |a Springer series in optical sciences ; |v v. 45

• 500 __ |a Includes index.

• 504 __ |a Bibliography: p. [405]-446.

• 650 _0 |a Scanning electron microscope.

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• 950 __ |a SCNU |f TN153/R363

• 998 __ |a SJT

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• 907 __ |a SCNU |f TN153/R363