机读格式显示(MARC)

• 000 01096nam 2200361 a 4500

• 001 0000399899

• 003 SCNU

• 005 20050715143838.0

• 008 981214s1983 enka b 00100 eng

• 020 __ |a 047126279X

• 040 __ |c SJT

• 050 0_ |a TP156.S95 |b P73 1983

• 082 0_ |a 620.1/1292 |2 19

• 093 __ |a O657 |2 4

• 099 __ |a CAL 022000309038

• 245 00 |a Practical surface analysis : |b by auger and x-ray photo-electron spectroscopy / |c edited by D. Briggs and M.P. Seah.

• 260 __ |a Chichester ; |a New York : |b Wiley, |c c1983.

• 300 __ |a xiv, 533 p. : |b ill. ; |c 24 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Surfaces (Technology) |x Analysis.

• 650 _0 |a Electron spectroscopy.

• 700 10 |a Briggs, D. |q (David), |d 1948-

• 700 10 |a Seah, M. P.

• 920 __ |a 231030 |b TB302.1 |c P895P |z 1

• 920 __ |a 231220 |z 1

• 920 __ |a 242120 |z 1

• 920 __ |a 215010 |z 1

• 950 __ |a SCNU |f O657/B854

• 998 __ |a SJT

• 999 __ |t C |A lm2 |a 20050715 14:37:35 |M lm2 |m 20050715 14:38:38

• 000 1000013332

• 991 __ |a 022005008849

• 907 __ |a SCNU |f O657/B854