机读格式显示(MARC)

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• 040 __ |a TSU |c TSU |d SCT

• 041 0_ |a eng |b chi

• 050 _4 |a TK7874 |b .A23 1990

• 082 04 |a 621.381/5 |2 20

• 093 __ |a TN431.2 |2 4

• 099 __ |a CAL 022004015429

• 100 1_ |a Abramovici, Miron.

• 245 10 |a Digital systems testing and testable design = |b 数字系统测试和可测性设计 / |c Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

• 246 31 |a 数字系统测试和可测性设计

• 260 __ |a 北京 : |b 清华大学出版社, |c 2004.

• 300 __ |a xvii, 652 p. : |b ill. ; |c 26 cm.

• 440 _0 |a 国外大学优秀教材. |p 微电子类系列（影印版）

• 504 __ |a Includes bibliographical references and index.

• 534 __ |p Reprint. Originally published: |c New York, N.Y. : John Wiley Sons Inc., c1990.

• 650 _0 |a Digital integrated circuits |x Testing.

• 650 _0 |a Digital integrated circuits |x Design and construction.

• 700 1_ |a Breuer, Melvin A.

• 700 1_ |a Friedman, Arthur D.

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• 907 __ |a SCNU |f TN431.2/A161