机读格式显示(MARC)

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• 008 801001s1980 waua b 101 0 eng

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• 040 __ |a DLC |c DLC |d DLC |d SCT

• 050 00 |a TA1522 |b .E97 1979

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• 111 2_ |a European Congress on Optics Applied to Metrology |n (2nd : |d 1979 : |c Strasbourg, France)

• 245 10 |a 2nd European Congress on Optics Applied to Metrology (METROP) : |b presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France / |c editors, Michel Grosmann, Patrick Meyrueis ; organized by European Photonics Association in collaboration with the Society of Photo-optical Instrumentation Engineers.

• 246 3_ |a Second European Congress on Optics Applied to Metrology (METROP)

• 260 __ |a Bellingham, Wash. : |b Society of Photo-optical Instrumentation Engineers, |c c1980.

• 300 __ |a x, 228 p. : |b ill. ; |c 28 cm.

• 440 _0 |a Proceedings of the Society of Photo-optical Instrumentation Engineers ; |v v. 210

• 504 __ |a Includes bibliographical references and indexes.

• 650 _0 |a Optical measurements |v Congresses.

• 650 _0 |a Holographic interferometry |v Congresses.

• 650 _0 |a Speckle metrology |v Congresses.

• 700 1_ |a Grosmann, Michel.

• 700 1_ |a Meyrueis, Patrick.

• 710 2_ |a European Photonics Association.

• 710 2_ |a Society of Photo-optical Instrumentation Engineers.

• 711 2_ |a Optics, Photonics, and Iconics Engineering Meeting |d (1979 : |c Strasbourg, France)

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