机读格式显示(MARC)
- 000 01027nam a2200277 a 4500
- 008 140421r20142010cc a b 001 0 eng d
- 020 __ |a 9787560342818 (pbk.)
- 099 __ |a CAL 022014024778
- 245 00 |a Characterization in compound semiconductor processing = |b 化合物半导体加工中的表征 / |c [editors], Gary E. McGuire, Yale E. Strausser.
- 260 __ |a 哈尔滨 : |b Harbin Institute of Technology Press, |c 2014.
- 300 __ |a xvi, 199 p. : |b ill. ; |c 23 cm.
- 490 0_ |a Materials characterization serise = |a 材料表征原版系列丛书
- 504 __ |a Includes bibliographical references and index.
- 534 __ |p Reprint. Originally published: |c New York : Momentum Press, 2010. |z 9781606500415.
- 650 _0 |a Compound semiconductors.
- 650 _0 |a Compound semiconductors |x Surfaces.
- 700 1_ |a Strausser, Yale.
- 950 __ |a SCNU |f TN304.2/M478