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• 111 2_ |a International Conference on Secondary Ion Mass Spectrometry |n (2nd : |d 1979 : |c Stanford University)

• 245 10 |a Secondary ion mass spectrometry, SIMS-II : |b proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) / |c editors, A. Benninghoven ... [et al.].

• 246 30 |a SIMS-II

• 260 __ |a Berlin : |b Springer-Verlag, |c 1979.

• 300 __ |a xiii, 298 p. : |b ill. ; |c 24 cm.

• 490 1_ |a Springer series in chemical physics ; |v 9

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Secondary ion mass spectrometry |v Congresses.

• 700 1_ |a Benninghoven, A.

• 830 _0 |a Springer series in chemical physics ; |v v. 9.

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