机读格式显示(MARC)

• 000 01290nam 2200445 a 4500

• 001 0000396590

• 003 SCNU

• 005 20050710165049.0

• 008 751229s1976 nyu b 00110 eng

• 010 __ |a 75045196 //r90

• 020 __ |a 0080196926

• 040 __ |a DLC |c DLC |d DLC

• 050 00 |a QD945 |b .T36 1976

• 082 00 |a 548/.83

• 093 __ |a O434.1 |2 4

• 099 __ |a CAL 022000292191 |a CAL 022000332993

• 100 1_ |a Tanner, B. K. |q (Brian Keith)

• 245 10 |a X-ray diffraction topography / |c by B. K. Tanner.

• 260 __ |a New York : |b Pergamon Press, |c 1976.

• 300 __ |a xiii, 174 p. ; |c 26 cm.

• 490 0_ |a International series in the science of the solid state ; v. 10

• 490 0_ |a Pergamon international library

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a X-ray crystallography.

• 920 __ |a 211010 |b O721 |c T157 |z 1

• 920 __ |a 242010 |z 1

• 920 __ |a 231030 |b O721 |c T166X |z 1

• 920 __ |a 244050 |z 1

• 920 __ |a 231220 |z 1

• 920 __ |a 212010 |z 1

• 920 __ |a 245010 |z 1

• 920 __ |a 231010 |z 1

• 920 __ |a 261020 |z 2

• 920 __ |a 243040 |z 0

• 950 __ |a SCNU |f O434.1/T166

• 998 __ |a PUL

• 999 __ |t C |A wp |a 20050710 16:50:16 |M wp |m 20050710 16:50:49

• 000 1000009989

• 991 __ |a 022005005483

• 907 __ |a SCNU |f O434.1/T166