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• 099 __ |a CAL 022008130584

• 100 1_ |a Alford, Terry L.

• 245 10 |a Fundamentals of nanoscale film analysis = |b 纳米薄膜分析基础 / |c T.L. Alford, L.C. Feldman, J.W. Mayer.

• 246 31 |a 纳米薄膜分析基础

• 260 __ |a 北京 : |b 科学出版社, |c 2008.

• 300 __ |a xii, 336 p. : |b ill. ; |c 25 cm.

• 440 _0 |a 国外物理名著系列 ; |v 17

• 504 __ |a Includes bibliographical references and index.

• 534 __ |p Reprint. Originally published: |c New York : Springer, c2007. |z 9780387292601.

• 650 _0 |a Thin films.

• 650 _0 |a Nanostructured materials.

• 700 1_ |a Feldman, Leonard C.

• 700 1_ |a Mayer, James W., |d 1930-

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