机读格式显示(MARC)

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• 003 SCNU

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• 008 981216s1984 enka b 00110 eng

• 020 __ |a 0201144034

• 040 __ |c SJT

• 050 0_ |a TK7868.L6 |b B45 1984

• 082 0_ |a 621.3819/535 |2 19

• 093 __ |a TP331.1 |2 4

• 099 __ |a CAL 022000311677

• 100 1_ |a Bennetts, R. G.

• 245 10 |a Design of testable logic circuits / |c R.G. Bennetts.

• 260 __ |a London ; |a Reading, Mass. : |b Addison-Wesley Pub. Co., |c c1984.

• 300 __ |a xii, 164 p. : |b ill. ; |c 25 cm.

• 440 _0 |a Microelectronics systems design series

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Logic circuits.

• 650 _0 |a Logic circuits |x Testing.

• 920 __ |a 231030 |b TP331.1 |c B472D |z 1

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• 950 __ |a SCNU |f TP331.1/B472

• 998 __ |a SJT

• 999 __ |t C |A wp |a 20050718 10:56:28 |M wp |m 20050718 10:57:02

• 000 1000016055

• 991 __ |a 022005011497

• 907 __ |a SCNU |f TP331.1/B472