机读格式显示(MARC)
- 000 01198nam a2200373 a 4500
- 008 071005s2008 enka b 001 0 eng
- 020 __ |a 9780470027844 (cloth)
- 020 __ |a 9780470027851 (paper)
- 040 __ |a DLC |c DLC |d BTCTA |d BAKER |d YDXCP |d HUA |d SCT
- 050 00 |a TA417.23 |b .B73 2008
- 082 00 |a 620.1/1299 |2 22
- 099 __ |a CAL 022008112393
- 245 10 |a Microstructural characterization of materials / |c David Brandon and Wayne Kaplan.
- 260 __ |a Chichester, England : |b John Wiley, |c c2008.
- 300 __ |a xiv, 536 p. : |b ill. (some col.) ; |c 25 cm.
- 440 _0 |a Quantitative software engineering series
- 504 __ |a Includes bibliographical references and index.
- 530 __ |a Also issued online.
- 650 _0 |a Materials |x Microscopy.
- 650 _0 |a Microstructure.
- 700 1_ |a Kaplan, Wayne D.
- 950 __ |a SCNU |f TB303/B819-2
- 999 __ |t C |A zxq |a 20090609 08:51:55 |M zxq |m 20090609 08:54:19 |G zxq |g 20090609 09:12:31
- 907 __ |a SCNU |f TB303/B819-2