机读格式显示(MARC)
- 000 01925nam 2200493 a 4500
- 008 801027s1980 nyua b 101 0 eng
- 010 __ |a 80026509 //r905
- 040 __ |a DLC |c DLC |d DLC
- 050 00 |a QD921 |b .N38 1979
- 099 __ |a CAL 022000292288 |a CAL 022000327646 |a CAL 021999620691 |a CAL 022000879459
- 111 2_ |a NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods |d (1979 : |c Durham, England)
- 245 10 |a Characterization of crystal growth defects by X-ray methods : |b [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / |c edited by Brian K. Tanner and D. Keith Bowen.
- 260 __ |a New York, N.Y. : |b Plenum Press, |c c1980.
- 300 __ |a xxvi, 589 p. : |b ill. ; |c 26 cm.
- 440 _0 |a NATO advanced study institutes series : Series B, Physics ; |v v. 63
- 500 __ |a "Published in cooperation with NATO Scientific Affairs Division."
- 504 __ |a Includes bibliographical references and index.
- 650 _0 |a Crystals |x Defects |v Congresses.
- 650 _0 |a X-ray crystallography |v Congresses.
- 700 1_ |a Tanner, B. K. |q (Brian Keith)
- 700 1_ |a Bowen, D. Keith |q (David Keith), |d 1940-
- 920 __ |a 211010 |b O78-53 |c N811 |z 1
- 920 __ |a 231030 |b O72-53 |c N864C 1979 |z 1
- 950 __ |a SCNU |f O72-53/N864
- 999 __ |t C |A wjh2 |a 20050715 15:03:02 |M wjh2 |m 20050715 15:03:29
- 907 __ |a SCNU |f O72-53/N864