机读格式显示(MARC)

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• 001 0000391419

• 003 SCNU

• 005 20050309094649.0

• 008 040224s2004 enka b 001 0 eng

• 010 __ |a 2004045180

• 020 __ |a 0521453739

• 040 __ |a DLC |c DLC |d YDX

• 042 __ |a pcc

• 050 00 |a QC176.84.S93 |b I24 2004

• 082 00 |a 530.4/275 |2 22

• 093 __ |a O57 |2 4

• 100 1_ |a Ichimiya, Ayahiko, |d 1940-

• 245 10 |a Reflection high-energy electron diffraction / |c Ayahiko Ichimiya and Philip I. Cohen.

• 260 __ |a Cambridge, U.K. ; |a New York : |b Cambridge University Press, |c 2004.

• 300 __ |a xi, 353 p. : |b ill. ; |c 26 cm.

• 504 __ |a Includes bibliographical references (p. 335-349) and index.

• 650 _0 |a Reflection high energy electron diffraction.

• 650 _0 |a Thin films |x Surfaces |x Analysis.

• 700 1_ |a Cohen, Philip I.

• 950 __ |a SCNU |f O57/I16

• 999 __ |M zxq |m 20050309 09:46:49 |G zxq |g 20050309 09:47:00

• 000 1000004508

• 991 __ |a 022005000101

• 907 __ |a SCNU |f O57/I16