机读格式显示(MARC)

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• 035 __ |a (OCoLC)4255697

• 040 __ |a NSDP |c NSDP |d DLC |d NSDP |d AIP |d NST |d NSDP |d NST |d EBZ |d NSDP |d SCNU

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• 050 00 |a TK7869 |b .E444

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• 099 __ |a CAL 121999009814

• 210 0_ |a Electr. test

• 222 _0 |a Electronics test

• 245 00 |a Electronics test.

• 260 __ |a [San Francisco, CA, etc., |b Miller Freeman Publications, etc.]

• 300 __ |a v. |b ill. |c 29 cm.

• 310 __ |a 13 no. a year |b <, July 1986->

• 321 __ |a Monthly, |b July/Aug. 1978-

• 362 1_ |a Ceased with issue for Aug. 1990.

• 362 0_ |a July/Aug. 1978-

• 510 2_ |a Physics abstracts |x 0036-8091 |b Feb. 1979-1990

• 510 2_ |a Electrical & electronics abstracts |x 0036-8105 |b Feb. 1979-1990

• 510 2_ |a Computer & control abstracts |x 0036-8113 |b Feb. 1979-1990

• 515 __ |a Vols. for <1986-> also called <v. 9->

• 650 _0 |a Automatic checkout equipment |x Periodicals.

• 650 _0 |a Electronic apparatus and appliances |x Testing |x Periodicals.

• 785 04 |t Test & measurement world |x 0744-1657 |w (DLC) 82641780 |w (OCoLC)8077236

• 950 __ |a SCNU |f TN/4

• 998 __ |a NJU

• 999 _0 |a CN |b SCNU |c 20040319 |M hwei3 |m 20090504 16:46:18

• 000 1900000237

• 991 __ |a 122004000285

• 907 __ |a SCNU |f TN/4