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• 000 01592nam a2200361 a 4500

• 001 0000400472

• 003 SCNU

• 005 20170421100100.0

• 008 960410s1978 ne af b 101 0 eng

• 010 __ |a 78022081 //r89

• 020 __ |a 0444851305

• 020 __ |a 0444851283 (v. 1)

• 020 __ |a 0444851291 (v. 2)

• 040 __ |d ICU |c WUL

• 093 __ |a TB302 |2 4

• 099 __ |a CAL 021999623765 |a CAL 022000379366

• 245 00 |a Diffraction and imaging techniques in material science / |c editors, S. Amelinckx, R. Gevers, J. Van Landuyt.

• 250 __ |a 2nd, rev. ed.

• 260 __ |a Amsterdam : |b North-Holland Pub. Co., |c 1978.

• 300 __ |a 1 v. in 2 (xvii, 847 p., [1] fold. leaf of plates) : |b ill. ; |c 21 cm.

• 500 __ |a Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.

• 500 __ |a Library has: v. 1-2.

• 504 __ |a Includes bibliographical references and index.

• 505 0_ |a v. 1. Electron microscopy -- v. 2. Imaging and diffraction techniques.

• 650 _0 |a Electron microscopy |x Congresses.

• 650 _0 |a Electrons |x Diffraction |x Congresses.

• 650 _0 |a Imaging systems |x Congresses.

• 700 1_ |a Amelinckx, S. |q (Severin)

• 700 1_ |a Gevers, R.

• 700 1_ |a Landuyt, J. van.

• 711 2_ |a International Summer Course on Material Science |d (1969 : |c Antwerp, Belgium). |t Modern diffraction and imaging techniques in material science.

• 920 __ |a 242430 |z 2

• 950 __ |a SCNU |f TB302/A498-2