机读格式显示(MARC)

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• 210 0_ |a IEEE des. test comput.

• 222 _0 |a IEEE design & test of computers

• 245 00 |a IEEE design & test of computers / |c IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc.

• 246 17 |a IEEE design & test

• 246 10 |a IEEE design and test

• 246 10 |a Design and test of computers

• 246 10 |a Design & test of computers

• 246 10 |a IEEE design and test of computers

• 260 __ |a Los Alamitos, CA : |b IEEE Computer Society, |c c1984-

• 300 __ |a v. : |b ill. ; |c 28 cm.

• 310 __ |a Quarterly, |b Mar. 1991-

• 321 __ |a Bimonthly, |b <Oct. 1987>-Dec. 1990

• 321 __ |a Quarterly, |b Feb. 1984-

• 362 0_ |a Vol. 1, no. 1 (Feb. 1984)-

• 500 __ |a Title from cover.

• 510 2_ |a Safety science abstracts journal |x 0160-1342

• 510 2_ |a Pollution abstracts with indexes |x 0032-3624

• 510 2_ |a ISMEC bulletin |x 0306-0039

• 510 2_ |a International aerospace abstracts |x 0020-5842 |b 1984-

• 510 2_ |a Electronics and communications abstracts journal (Riverdale) |x 0361-3313

• 510 1_ |a Index to IEEE publications |x 0099-1368

• 515 __ |a Vol. 1, no. 1 also called premiere issue.

• 530 __ |a Available also on microfilm and microfiche from the Institute of Electrical and Electronics Engineers.

• 650 _0 |a Electronic digital computers |x Testing |x Periodicals.

• 650 _0 |a Computer engineering |x Periodicals.

• 710 20 |a Institute of Electrical and Electronics Engineers.

• 710 20 |a IEEE Computer Society.

• 776 1_ |t IEEE design & test of computers |w (DLC)sn 85019938 |w (OCoLC)10596192

• 776 1_ |t IEEE design & test of computers |w (OCoLC)13246898

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• 907 __ |a SCNU |f TP3/76